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 New ARTech Technologies Ltd.


Tanner AMS and MEMS Flows

Integrated, affordable, and intuitive, used by more than 25,000 designers around the world.


Tanner EDA has earned an outstanding reputation as the price performance leader for the design, layout and verification of analog/mixed-signal (AMS) ICs, as well as MEMS and IoT devices.


Now an integral part of Mentor Graphics, Tanner EDA builds on our extensive technology leadership and global footprint to reach AMS designers around the world.



Tanner Analog/Mixed-Signal IC Design Flow





























Affordable, integrated analog/mixed-signal design flow that is easy to customize to your environment. Learn More ►




Tanner MEMS Design Flow























Affordable, easy-to-use 3D MEMS design environment for faster time to market. Learn More ►

Tanner AMS IC Design Flow

Affordable, integrated analog/mixed-signal design flow that is easy to customize to your environment


Tanner AMS IC design flow (formerly HiPer Silicon AMS IC design flow) supports analog/mixed-signal design in one highly-integrated, end-to-end flow. Engineers can perform top-down, mixed-signal simulation or co-simulation, synthesis with DFT support, place and route, and high-speed, “sign-off ready” timing analysis for tape-out, within one cost-effective, unified flow.


            OpenAccess, LEF/DEF, Liberty and SDF support
            Simulate combined netlists: behavioral models, block-level RT/gate and transistor-level blocks
            Debugging and support of advanced verification with SystemC and System Verilog
            Proven, compatible synthesis with DFT support
            Hierarchical DRC and netlist extraction
            All-angle design rule checking (DRC) with interactive and real-time DRC
            Foundry PDK support

Tanner Analog IC Design Flow

Complete, integrated analog design flow that is flexible and easy to use, speeding your time to working silicon

The Tanner Analog IC design environment (formerly HiPer Silicon Analog design flow) increases productivity from design, simulation, implementation, physical layout and verification, to foundry-proven tape-out.


         OpenAccess and iPDK support
         Accurate SPICE simulator compatible with HSPICE and Verilog-A
         View simulation results directly on the schematic
         Complete hierarchical layout editor with SDL and manual-assisted routing
         Real-time, interactive DRC
         Automatically generates current mirrors, differential pairs, and arrays
         Calibre®-compatible, hierarchical DRC and netlist extraction 
         Extract RC parasitics with fast 2D or ultra-accurate 3D

Design and Simulation

Tanner S-Edit Schematic Capture

User friendly schematic capture environment for even the most complex analog/mixed-signal designs. Learn More ►


Tanner T-Spice Simulation

Fast, accurate, foundry-proven simulation for demanding analog/mixed-signal designs. Learn More ►


Tanner Waveform Viewer

Intuitive interface for viewing, comparing and analyzing simulation results. Learn More ►


Tanner L-Edit IC Layout

A complete analog/mixed-signal IC physical design environment that is flexible and highly configurable. Learn More ►


Tanner Verify DRC and LVS

Comprehensive AMS IC design-rule checking (DRC) and netlist extraction that's fast and easy to use. Learn More ►


Tanner Parasitic Extraction

Fast, accurate extraction of circuit parasitics to model device behavior and verify design performance. Learn More ►

Tanner Calibre® One DRC/LVS/xRC

Confidently tape out analog/mixed-signal designs with Calibre’s industry leading DRC, LVS, and parasitic extraction tools.

      ✔     Tanner-Calibre One is a key part of Tanner’s complete, full-flow analog/mixed-signal (AMS) IC design suite.

      ✔    The Tanner schematic capture tool S-Edit and the physical layout editor L-Edit is tightly integrated with the Calibre verification suite.

      ✔     The Calibre platform is the industry-leader for physical verification and is qualified for sign-off by every major IC foundry and the Tanner       

               Calibre One verification suite uses the same Calibre design kits

      ✔   Tanner Calibre One DRC/LVS/xRC license can only be used with Tanner L-Edit.




The Tanner Calibre One verification suite includes the following tools:


Calibre nmDRC
Hierarchical design rule checking

Calibre nmDRC™ ensures the physical layout can be manufactured. This industry-leading tool provides fast cycle times and innovative design rule capabilities.


Calibre xRC
Parasitic extraction

Calibre xRC™ verifies that layout-dependent effects do not adversely affect the electrical performance of the design, delivering accurate parasitic data for comprehensive and accurate post-layout analysis and simulation.


Calibre nmLVS
Hierarchical layout versus schematic

Calibre nmLVS™ checks that the physical layout is electrically and topographically the same as the schematic. It improves designer productivity by providing actual device geometry measurement and sophisticated interactive debugging capabilities to ensure accurate verification.


Calibre RVE
Graphical results viewing environment

Calibre RVE™ brings the solution together, providing a graphical results viewing environment that reduces debug time by visually identifying design issues instantly and cross-selecting the associated issue in L-Edit and S-Edit.


Calibre Interactive
Calibre Interactive: Calibre® Interactive™ is the invocation GUI for Calibre DRC™, LVS and xRC™ tools for physical verification and parasitic extraction. It's easily accessed from the menu bar within popular layout design environments.

Tanner Designer



Tanner Designer helps teams easily track analog verification throughout the entire design cycle.

Tanner Designer is an analog verification management tool that tracks all simulations for a project. The tool displays simulation results in a convenient dashboard allowing the team to quickly see which blocks pass or fail specifications and to monitor verification progress. The tool is fully integrated with S-Edit, T-Spice, Eldo, and the Tanner Waveform Viewer.


Tanner Designer automatically sends measurement results to a Microsoft® Excel® workbook each time a simulation is run, allowing the team unlimited flexibility to capture specification requirements, specify formulas to calculate if the block meets specifications, and to generate custom reports. The team can immediately start managing analog verification with no tool learning curve and without using proprietary tool languages.


Easy to set up and to customize
      Simply point to where simulations are stored and the tool aggregates all measurements
 •    Incrementally customize as the project progresses
      Supports a wide range of design verification methodologies





Manage all simulations within a project
        Launch and rerun specified simulations
•     Group and sort results
    Specify pass or fail parameters



Present measurement results
        Compare the results against the reference
     Generate custom reports
     Build documentation


Tanner L-Edit IC Layout


A complete analog/mixed-signal IC physical design environment that is flexible and highly configurable

Create layouts that match the schematic the first time, maximizing efficiency and reducing the CAD manager’s support burden. Get up and running easily with platform independence and flexible licensing. Reduce manual routing with:


        Real-time net flylines
     Nets & pins tracking
•    Geometry marking/highlighting/by net
    ECO tracking
•    Available for Windows and Linux

Complete hierarchical physical layout 
Rich environment with a host of ease-of use features, including:

   •     Object-snapping
       Node highlighting
•     Macro support
•     Layout generators

Supports critical industry standards
   •    OpenAccess read/write
     Schematic-driven layout (SDL) support
•    Uses netlist files in T-Spice HSPICE, PSpice, structural Verilog, or CDL formats

Optimized performance
    Fast rendering speeds and interactive, real-time design rule checking (DRC)

Extensive array of tool options and add-ons
Extend Tanner L-Edit IC capabilities with specialty tools and modules, including Tanner SDL Router.

Direct Calibre®/Calibre RVE support with EVI
Tanner External Verification Interface (EVI) seamlessly integrates with the Calibre tool suite, allowing you to leverage investments in both environments

Tanner MEMS Design Flow


Affordable, easy-to-use 3D MEMS design environment for faster time to market

Tanner MEMS design flow delivers 3D MEMS design and fabrication support in one unified environment, and makes it easy to integrate MEMS devices with analog/mixed-signal processing circuitry on the same IC. Foundry-proven, it enhances the manufacturability of MEMS devices via mechanical, thermal, acoustic, electrical, electrostatic, magnetic and fluid analyses.

       Create a MEMS 3D model from layout
    Highly programmable layout editor with MEMS-friendly capabilities, such as curved polygons
•   Design rule checking for MEMS manufacturability
•   System-level simulation of IC design and MEMS devices
    Complete layer & design geometry visualization
•   Automatically generate behavioral models of your MEMS devices
•   Import DXF with boundary reconstruction, export DXF
     Available for Windows or Linux

Addressing the challenges of IoT Design
Internet of Things (IoT) designs mesh together several design domains in order to successfully develop a product that interfaces real-world activity to the internet. Individually, these design domains are challenging for today’s engineers. Bringing them all together to create an IoT product can place extreme pressure on design teams. Via this whitepaper the challenges of IoT Design are addressed. The fundamental challenge of IoT design is working in four design domains; analog, digital, RF, and MEMS. The Tanner design flow is architected to seamlessly work in any of the design domains by employing an integrated design flow for design, simulation, layout, and verification.

Advanced 3D analysis tools
Supports mechanical, thermal, acoustic, electrical, electrostatic, magnetic and fluid analyses.

Complex polygon Boolean operations
Reduces errors and increases productivity.

Automatic layout generation with parameterized cells
Cells can be compiled for speed and/or distribution, programmed in C++ or Tcl. Supports external interfaces.

Advanced mask layout and verification flow
Support for a wide variety of MEMS foundry-proven process support available.

Tanner Place & Route


Integrated, flexible digital place & route tool that speeds development of analog/mixed-signal designs
Tanner Place & Route is optimized for the needs of 'big' analog / 'little' digital mixed-signal designs on typical analog process nodes. It is a critical part of the Tanner AMS end-to-end flow for analog/mixed-signal designs. Highly flexible, Tanner Place & Route delivers unparalleled flexibility during every phase of the flow.


   •      Clock-tree synthesis
       SDF timing extraction
       Interactive, cost-effective tool
      Available for Windows and Linux

Supports standard digital formats
Clock-tree synthesis
SDF timing extraction
Interactive, cost-effective tool
Available for Windows and Linux

Designed for analog specialty process nodes
Tanner Place and Route tool was developed for analog specialty process technologies on nodes of 90nm and above, with 10k to 50k gates of digital logic.

Intuitive, easy to use
Fast, easy learning curve allows you to get up to speed quickly on the tool and maximize productivity.

Tanner S-Edit Schematic Capture


User-friendly schematic capture environment for even the most complex analog/mixed-signal designs

Tanner S-Edit schematic capture increases your design productivity while handling the most complex IC designs. This powerful environment supports fast, 64-bit rendering and cross-probing between schematic, layout, and LVS reporting at net and device levels. 


   •        Industry-standard support including tight SPICE simulation integration and waveform cross-probing
•         Directly view operating point simulation results in the schematic
•         Cross-probe between schematic, layout and LVS report with net/device highlighting
•         Configurable schematic Electrical Rule Checks (ERC)
•         Advanced array and bus support
•         Integrated with Tanner L-Edit IC to speed the layout and ECO process
•         Available for Windows and Linux

Easy to use
Intuitive, with an easy learning curve that gets you up and running quickly

Property callbacks and multiple views per cell
Including SPICE, schematic, Verilog, Verilog-A and Verilog-AMS views

Industry-standard import and export support
   •      Export to SPICE, EDIF, Verilog, and VHDL
•     Import from OpenAccess, and EDIF, with automatic conversion of files from Mentor and other third-party tools

Tanner T-Spice Simulation


Fast, accurate, foundry-proven simulation for demanding analog/mixed-signal designs

Tanner T-Spice simulation integrates easily with other design tools and is compatible with industry-leading standards. It improves simulation accuracy with advanced modeling, multi-threading support, device-state plotting, real-time waveform viewing, and analysis, and a command wizard for simple SPICE syntax creation.


   •    Fast, accurate analog/mixed-signal circuit simulation with support for multi-threading
     Accurately characterize circuit behavior with virtual data measurements, parameter sweeping, Monte Carlo, DC/AC, and transient-noise analysis
•    Supports Levenberg-Marquardt non-linear optimizer, plot statements and parameter definitions, plus bit or bus logic waveform inputs
      Lowest total cost of ownership in the industry
      Available for Windows or Linux

Intuitive and easy to use
Fast learning curve gets your designers up to speed quickly

          RTL to GDSII, PDKs, and foundry process support
•     Supports PSP, BSIM3.3 & 4.6, BSIM SOI 4.0, EKV 2.6, MOS 9, RPI a-SI and Poly-Si TFT, VBIC, and MEXTRAM models

Supports key industry standards
   •     HSPICE- and PSpice-compatible syntax
•     Verilog-A and Verilog-AMS support for advanced modeling- create customized models of any device

Tanner Waveform Viewer

Intuitive interface for viewing, comparing and analyzing simulation results


Tanner Waveform Viewer (formerly known as W:Edit) provides an intuitive multiple-window, multiple-chart interface for easy viewing of waveforms and data in highly configurable formats.


   •        Dynamically linked to Tanner T-Spice simulation and Tanner S-Edit schematic capture 
•       Waveform cross-probing directly in the schematic editor
•       Easily handles large (10GB+) data files
•       Available for Windows or Linux
•       Create new traces based on mathematical expressions of other traces for advanced analysis and easy comparison with measured data max,

              min, average, intersect, rms, over/undershoot, amplitude, error, crossing, delay, period, frequency, rise/falltime, jitter, pulse width, settling time,

              integral, derivative, duty cycle, and slew rate


Automatically calculate & display FFT results
             dB or linear magnitude
           Wrapped or unwrapped phase
•        Use for real or imaginary parts

Intuitive, easy-to-use features
            Dynamic annotations
•       High-performance trace navigator

Run-time updates
See simulation results as they are being generated

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